Nanounity

07/18/2012

Topcon SEM workshop at Texas A&M University

10/30/2009

This was an ionscope workshop hosted by the Nano Pico Charaterization Lab, at UCLA CNSI on 10-27-09.

10/24/2009

This is a video screen capture off a Veeco/DI D3100 with an Invenios XY flexure scanner, scanning a read/write head. The Invenios flexure design enables extremley low out-of-plane motion and higher scan speeds than conventional AFM scanners. The video capture seen here is a 40 micron area from a 200 micron XY scanner, acquired at 5 Hz. Notice that the scan is flat and fast, curvature removal is not necessary with this scanner. These scanners are available for various types of AFM systems. For more details about the AFM scanner upgrade visit www.nanounity.com.

10/24/2009

This is a video screen capture off a Veeco/DI D3100 with an Invenios XY flexure scanner, scanning a read/write head. The Invenios flexure design enables extremley low out-of-plane motion and higher scan speeds than conventional AFM scanners. The video capture seen here is a 40 micron area from a 200 micron XY scanner, acquired at 8 Hz. Notice that the scan is flat and fast, curvature removal is not necessary with this scanner. These scanners are available for various types of AFM systems. For more details about the AFM scanner upgrade visit www.nanounity.com.

10/24/2009

These are pictures from our NT-MDT Spectra product training.

10/24/2009

09/04/2009

This is a video sequence taken by scanning ion conductance microscopy (SICM), a relatively new SPM technique now commercially available from ionscope Ltd. One of the significant benefits of SICM is high resolution, nano scale imaging of live cells. The video clip is a sequence of images from an A6 cell, taken over a 24 hour period. During the sequence you can see how the ridge structures are formed on the epithelial cells. Individual microvilli emerge along side one another and gradually merge building up extended ridges. Capturing these dynamic processes at this resolution for an extended time frame would be difficult or impossible with other microscopy techniques. The scan area taken is 40 microns x 40 microns. The scan size is comparable to conventional SPM techniques, but with living cells at higher resolution.

09/04/2009

Earlier this year, Nanounity launched an online AFM probe store. Our store features more than 350 different types of standard probes, covering a wide range of basic imaging and advanced application modes. As part of our services, we provide pre-mounted probes specifically for Pacific Nanotechnology AFM systems. Finding the probe you need is quick and easy, simply browse our pre-mounted probes for PNI AFM's category.

Nanounity! : - Si Nitride Membranes in Silicon Pre-mounted Probes Ambios AFM's Tipless Cantilevers Si Nitride Cantilever/Si Tip Si Nitride/Si Tip Non-Contact Si Nitride/Si Tip Force Curve MFM Probes Electrical ...

09/04/2009

NT-MDT new advanced development - universal control for all NT-MDT SPM systems.

NT-MDT new advanced development – a universal controller which supports all kind of SPM designed by our company - gives the freedom of unlimited research capabilities. Use of the most high-end technologies makes possible to increase productivity of data processing. ...

09/04/2009

2009 R&D 100 award for Solver Next, the first desktop automated SPM, has been recognized as one of top 100 technology advancements of the past year. Please follow the link to learn more about the story and Solver Next SPM.

Fully automated SPM SOLVER NEXT has been selected byindependent experts of R&D Magazine as the 2009 R&D 100 Award winner. This award recognizes the 100 most technologically significant products introduced into the marketplace over the past year.

09/02/2009

09/02/2009